A 70-GHz Effective Sampling Rate On-Chip Oscilloscope with Time-Domain Digitization

Abstract

An on-chip digitizer for the transient measurement of digital signal integrity is proposed. Undersampling, combined with single-path time-domain processing is used to perform the embedded measurement in a time-efficient manner. On-chip interconnect crosstalk generation with variable strength is included on chip for characterization, and successfully measured using a prototype chip, implemented in a 0.18 mum CMOS process. The proposed system is easily calibratable, with an estimated static power dissipation of ~3.5 mW. The total active area taken up by the associated test and calibration vehicles is 0.45 mm2