Luminescence properties of GaP1−xNx alloys grown on nominally (001)-oriented GaP-on-Si substrates by chemical beam epitaxy

K. Ben Saddik, P. Álamo, J. Lähnemann, R. Volkov, N. Borgardt, T. Flissikowski, O. Brandt, B. J. García, S. Fernández-Garrido
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Abstract

We investigate the optical properties of GaP1−xNx alloys, grown by chemical beam epitaxy (CBE) on (001)-oriented GaP-on-Si substrates, using cathodoluminescence and photoluminescence spectroscopy. In contrast to plasma-assisted molecular beam epitaxy, the optical properties of GaP1−xNx layers grown by CBE are found to be unaffected by ex situ rapid thermal annealing treatments. Regarding the effect of the N mole fraction, the luminescence intensity remains high for compositions up to the lattice match, then it decreases. Temperature-dependent measurements revealed the existence of two independent thermally activated quenching processes as well as the presence of localized states caused by compositional fluctuations. Upon extracting the long-range fluctuation energies, we derived a coupling coefficient value of 2.24 eV to describe the dependence of the band gap energy on x using the band anti-crossing model.
化学束外延法在名义(001)取向GaP-on-Si衬底上生长的GaP1−xNx合金的发光特性
我们利用阴极发光和光致发光光谱研究了化学束外延(CBE)在(001)取向GaP-on-Si衬底上生长的GaP1−xNx合金的光学性质。与等离子体辅助分子束外延相比,CBE生长的GaP1−xNx层的光学性质不受非原位快速热退火处理的影响。对于N摩尔分数的影响,在晶格匹配之前,组合物的发光强度保持较高,然后减弱。温度相关的测量揭示了两个独立的热激活淬火过程的存在以及由成分波动引起的局部状态的存在。在提取长程涨落能量的基础上,利用带抗交叉模型推导出耦合系数为2.24 eV的值来描述带隙能量与x的依赖关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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