Tong Yang, Yuguo Liu, Changxin Jin, Kai Jiang, Qiang Duan, Chen Song, Qibin Chen, Xue Li, Junzheng Ge, Rui Li
{"title":"Printed Circuit Board Defect Detection Based on Improved YOLOv5","authors":"Tong Yang, Yuguo Liu, Changxin Jin, Kai Jiang, Qiang Duan, Chen Song, Qibin Chen, Xue Li, Junzheng Ge, Rui Li","doi":"10.1109/ICICT58900.2023.00019","DOIUrl":null,"url":null,"abstract":"Aiming at the problems of low efficiency and poor real-time performance in the printed circuit board (PCB) defect detection, a PCB defect detection method based on the improved YOLOv5 is proposed, which integrates the module of multiscale detection, attention mechanism and multi-branch. A shallow detection layer is added to detect smaller defect targets and fused with features of the deep network. An optimized anchor clustering method was used to obtain a more suitable size for the dataset. The Convolutional Block Attention Module (CBAM) is introduced to reweight and assign important feature channels to learn more valuable features. The re-parameterization convolution (RepConv) module is integrated to decouple the multi-branch training model into a single-way inference model by structural re-parameterization, which improves the model’s training performance and reduces inference time. The experimental results show that the detection accuracy of the proposed algorithm reaches 98.3% on the extended dataset, which is 3.4% higher than that of the original algorithm. At the same time, a real-time detection performance of 63 FPS is achieved, which satisfies the detection requirements of the PCB.","PeriodicalId":425057,"journal":{"name":"2023 6th International Conference on Information and Computer Technologies (ICICT)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 6th International Conference on Information and Computer Technologies (ICICT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICT58900.2023.00019","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Aiming at the problems of low efficiency and poor real-time performance in the printed circuit board (PCB) defect detection, a PCB defect detection method based on the improved YOLOv5 is proposed, which integrates the module of multiscale detection, attention mechanism and multi-branch. A shallow detection layer is added to detect smaller defect targets and fused with features of the deep network. An optimized anchor clustering method was used to obtain a more suitable size for the dataset. The Convolutional Block Attention Module (CBAM) is introduced to reweight and assign important feature channels to learn more valuable features. The re-parameterization convolution (RepConv) module is integrated to decouple the multi-branch training model into a single-way inference model by structural re-parameterization, which improves the model’s training performance and reduces inference time. The experimental results show that the detection accuracy of the proposed algorithm reaches 98.3% on the extended dataset, which is 3.4% higher than that of the original algorithm. At the same time, a real-time detection performance of 63 FPS is achieved, which satisfies the detection requirements of the PCB.