A Demo of Microservice for Customized Faulty Product Detection System in Smart Manufacturing

Nitesh Bharot, M. Soderi, J. Breslin
{"title":"A Demo of Microservice for Customized Faulty Product Detection System in Smart Manufacturing","authors":"Nitesh Bharot, M. Soderi, J. Breslin","doi":"10.1109/SMARTCOMP58114.2023.00040","DOIUrl":null,"url":null,"abstract":"Product failure detection in smart manufacturing is important because it allows manufacturers to quickly identify and isolate faulty products before they reach the end of the production line. In today’s fast-paced and highly competitive business environment, manufacturers need to quickly and accurately identify product failures to stay competitive and meet customer expectations. Previously the product quality was inspected manually and now it is examined using a machine learning algorithm to overcome the limitations of manual inspection. However, in the latter case AI and ML experts are required to do the task. Therefore, to overcome such dependency, this work proposes a microservice to allow the end user (an industry person, as well as an automated hardware/software agent) to test different combinations of data science and AI tools and technologies without any AI expertise. The proposed microservice exposes APIs that make it possible to select different combinations of feature selection, sampling, and classification algorithm. A demo environment with a Postman collection that includes few API calls to demonstrate how the proposed module enables customized selection to detect faulty products, is also discussed.","PeriodicalId":163556,"journal":{"name":"2023 IEEE International Conference on Smart Computing (SMARTCOMP)","volume":"357 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Conference on Smart Computing (SMARTCOMP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMARTCOMP58114.2023.00040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Product failure detection in smart manufacturing is important because it allows manufacturers to quickly identify and isolate faulty products before they reach the end of the production line. In today’s fast-paced and highly competitive business environment, manufacturers need to quickly and accurately identify product failures to stay competitive and meet customer expectations. Previously the product quality was inspected manually and now it is examined using a machine learning algorithm to overcome the limitations of manual inspection. However, in the latter case AI and ML experts are required to do the task. Therefore, to overcome such dependency, this work proposes a microservice to allow the end user (an industry person, as well as an automated hardware/software agent) to test different combinations of data science and AI tools and technologies without any AI expertise. The proposed microservice exposes APIs that make it possible to select different combinations of feature selection, sampling, and classification algorithm. A demo environment with a Postman collection that includes few API calls to demonstrate how the proposed module enables customized selection to detect faulty products, is also discussed.
智能制造中定制故障产品检测系统的微服务演示
智能制造中的产品故障检测非常重要,因为它使制造商能够在故障产品到达生产线末端之前快速识别和隔离故障产品。在当今快节奏和竞争激烈的商业环境中,制造商需要快速准确地识别产品故障,以保持竞争力并满足客户的期望。以前产品质量是人工检测,现在使用机器学习算法来克服人工检测的局限性。然而,在后一种情况下,需要人工智能和机器学习专家来完成任务。因此,为了克服这种依赖,这项工作提出了一个微服务,允许最终用户(一个行业人员,以及一个自动化的硬件/软件代理)在没有任何人工智能专业知识的情况下测试数据科学和人工智能工具和技术的不同组合。提出的微服务公开了一些api,这些api使选择特征选择、采样和分类算法的不同组合成为可能。本文还讨论了一个带有Postman集合的演示环境,该环境包含很少的API调用,以演示所建议的模块如何支持自定义选择以检测有缺陷的产品。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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