Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose

Abstract

The purpose of this study was to evaluate the effect of electrical aging on the cold cathode electron beam (C-beam). This experiment is performed by the vertically aligned carbon nanotube in which it is established that the applied bias for efficient electrical aging and defined the bias voltage as the voltage at which joule heating occurred. A long-term stable field electron emission from carbon nanotube arrays can be achieved through an aging process at high emission current. Additionally, x-ray imaging and dose measurement were used to assess the Focal Spot Size (FSS) of the tungsten cross wire used as a standard resolution testing object (EN 12543–5). We found that the aging had no significant effect on the FSS, but the x-ray dose rate enhanced from 0.45 mGy/sec to 1.1 mGy/sec.