Short term voltage withstand for testing of uncured high voltage form wound coil insulation

Donald P. McCredie, J. Watson
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Abstract

With the current trend away from fully cured insulation materials to uncured low binder mica tapes, a need to develop adequate proof testing methods during taping and stator winding has become increasingly evident. The motor/generator manufacturer or repair facility wants to test at as high a voltage as possible to detect faults but without risk of creating damage to the insulation. Too many end users of mica ground wall insulation continue to proof test using methods adaptable to material construction prior to the introduction of VPI processing. Since then (circa 1960) mica tape has been engineered by several manufacturers specifically for VPI. Several changes have been introduced to optimize resin impregnation and retention post cure. Lower dielectric breakdown values are initially obtained in the “green” or unprocessed state precure. Post cure the breakdown minimum frequently exceed 10 X rated voltage DC. It is necessary to proof test in the uncured state at lower values. This paper will report reasons for this necessity. Also included will be possible alternatives. Work will be continued to establish a maximum safe limit for uncured short term voltage withstand.
用于测试未固化的高压线圈绝缘的短期耐压
随着目前从完全固化的绝缘材料到未固化的低粘结云母带的趋势,在胶带和定子绕组期间开发足够的证明测试方法的需求日益明显。电机/发电机制造商或维修机构希望在尽可能高的电压下进行测试,以检测故障,但不存在损坏绝缘的风险。在引入VPI处理之前,太多云母地墙绝缘的最终用户继续使用适用于材料结构的方法进行证明测试。从那时起(大约1960年)云母磁带已经由几个制造商专门为VPI设计。介绍了优化树脂浸渍和保留后固化的几个变化。较低的介电击穿值最初是在“绿色”或未处理状态下获得的。后固化击穿的最小值经常超过直流额定电压的10倍。有必要在较低的值下进行未固化状态下的验证试验。本文将报告这种必要性的原因。还包括可能的替代方案。将继续开展工作,确定未固化短期耐压的最大安全限值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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