Chih-Ming Lin, Ting-ta Yen, V. Felmetsger, M. Hopcroft, J. Kuypers, A. Pisano
{"title":"Thermal compensation for aluminum nitride Lamb wave resonators operating at high temperature","authors":"Chih-Ming Lin, Ting-ta Yen, V. Felmetsger, M. Hopcroft, J. Kuypers, A. Pisano","doi":"10.1109/FREQ.2010.5556381","DOIUrl":null,"url":null,"abstract":"Thermal compensation for aluminum nitride (AlN) Lamb wave resonators operating at high temperature is experimentally demonstrated in this study. By adding a compensating layer of silicon dioxide (SiO<inf>2</inf>), the turnover temperature can be designed for high temperature operation by varying the normalized AlN thickness (h<inf>AlN</inf>/λ) and the normalized SiO2 thickness (h<inf>SiO2</inf>/λ) in the AlN/SiO<inf>2</inf> composite stack. With different designs of h<inf>AlN</inf>/λ and h<inf>SiO2</inf>/λ, the Lamb wave resonators were well temperature-compensated at 214°C, 430°C, and 542°C, respectively. Furthermore, several testing cycles in the full temperature range from 25°C to 700°C were taken to demonstrate the repeatability of the frequency characteristics. This thermal compensation technology is promising for future applications to piezoelectric resonators, filters, and sensors at high temperature.","PeriodicalId":344989,"journal":{"name":"2010 IEEE International Frequency Control Symposium","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Frequency Control Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2010.5556381","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Thermal compensation for aluminum nitride (AlN) Lamb wave resonators operating at high temperature is experimentally demonstrated in this study. By adding a compensating layer of silicon dioxide (SiO2), the turnover temperature can be designed for high temperature operation by varying the normalized AlN thickness (hAlN/λ) and the normalized SiO2 thickness (hSiO2/λ) in the AlN/SiO2 composite stack. With different designs of hAlN/λ and hSiO2/λ, the Lamb wave resonators were well temperature-compensated at 214°C, 430°C, and 542°C, respectively. Furthermore, several testing cycles in the full temperature range from 25°C to 700°C were taken to demonstrate the repeatability of the frequency characteristics. This thermal compensation technology is promising for future applications to piezoelectric resonators, filters, and sensors at high temperature.