Effect of Variation of Thickness on Integrated Antenna System in Silicon

A. Bin Islam, S. Mostafa, W. Tushar, A. Rashid
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引用次数: 2

Abstract

In this study we have investigated the effects of variation of silicon substrate thickness on the gain of integrated antennas in on-chip wireless interconnect system. The antennas were fabricated on silicon wafer and the excitation was applied horizontally. Simulation of the test structure has been carried out using ANSOFT High Frequency Structure Simulation (HFSS) program employing the three dimensional finite element methods. A simple analytical model is also developed, using ground reflection (two ray) model to predict the gain in various thicknesses of silicon substrate. Results obtained from the analytic model and simulated data are presented here for comparison.
厚度变化对硅基集成天线系统的影响
本文研究了片上无线互连系统中硅衬底厚度变化对集成天线增益的影响。天线在硅片上制作,激励是水平施加的。利用ANSOFT高频结构仿真软件(HFSS)对试验结构进行了三维有限元模拟。本文还建立了一个简单的解析模型,利用地面反射(双射线)模型来预测硅衬底在不同厚度下的增益。本文给出了分析模型和模拟数据的计算结果进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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