Sub-barrier and Above-barrier Electron Transport Through Multilayer Semiconductors

Voxob Rustamovich Rasulov, R. Rasulov, Iqboljon Mamirjonovich Eshboltayev, R. R. Sultanov
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Abstract

The transparency coefficients of the semiconductor structure consisting of alternating asymmetric potential barriers and wells are calculated, where taken into account the Bastard condition. It is shown that both in the above-barrier and over barrier passage of electrons, tunneling oscillations arise. The amplitude, in this case, is determined not only by the values of the wave vectors, but from the values of the effective masses of the current carriers. This oscillation does not disappear even in symmetric structures if they have a difference in the effective masses of current carriers located in two neighboring regions. In symmetrical structures, an oscillation of the coefficient of the above-barrier passage of a particle depending on its energy should be observed without taking into account the Bastard condition. Calculations show that for equal values of the width of the well and the potential barrier, as well as jumps in the potential of the barrier or well, the amplitude of the oscillations of the coefficient of over-barrier passage of particles is greater than the coefficient of passage above the well. In the case of an asymmetric structure, these considerations remain valed, but the physical nature of the parameters, for example, the number of oscillations, reflection and transmission coefficients, strongly depends on the ratio of the effective masses of electrons in neighboring layers and from the ratio of the height of the left and right potential barrier (regarding to the well). In an asymmetric (and in a symmetric, but with different effective masses of electrons in different layers) semiconductor structure, oscillation should be observed depending on the coefficient of transmission through the potential barrier on the energy of electron. This oscillation is caused by the interference of waves going to the barrier and reflected from the potential barrier. Such an interference phenomenon in the structure does not disappear even in a symmetric structure due to the difference in the effective masses of electrons located in different regions of the structure. The electronic states of a multilayer semiconductor structure consisting of alternating potential wells and barriers are analyzed.
多层半导体的亚势垒和势垒以上电子传输
考虑Bastard条件,计算了由交替不对称势垒和阱组成的半导体结构的透明系数。结果表明,电子在势垒上和势垒上的穿越都产生了隧穿振荡。在这种情况下,振幅不仅由波矢量的值决定,而且由电流载波的有效质量的值决定。即使在对称结构中,如果位于两个相邻区域的载流子的有效质量存在差异,这种振荡也不会消失。在对称结构中,在不考虑Bastard条件的情况下,应该观察到粒子的势垒上通过系数取决于其能量的振荡。计算表明,当势垒宽度和势垒宽度相等,势垒或势垒的势跃迁时,粒子过势垒通过系数的振荡幅度大于过势垒通过系数的振荡幅度。在不对称结构的情况下,这些考虑仍然是有价值的,但是参数的物理性质,例如振荡次数、反射系数和透射系数,在很大程度上取决于邻近层中有效电子质量的比例,以及左右势垒高度的比例(相对于井)。在不对称(和对称,但不同层的有效电子质量不同)半导体结构中,应观察到振荡,这取决于通过势垒对电子能量的透射系数。这种振荡是由到达势垒并从势垒反射的波的干涉引起的。由于位于结构不同区域的电子有效质量的差异,即使在对称结构中,这种结构中的干涉现象也不会消失。分析了由交变势阱和势垒组成的多层半导体结构的电子态。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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