RADIATION EFFECTS IN INTEGRATED CHIPS WHEN EXPOSED TO IONIZING RADIATION

I. Zhuravleva
{"title":"RADIATION EFFECTS IN INTEGRATED CHIPS WHEN EXPOSED TO IONIZING RADIATION","authors":"I. Zhuravleva","doi":"10.34220/mamsp_214-218","DOIUrl":null,"url":null,"abstract":"In the onboard equipment, components of electronics, which have increased sensitivity to the effects of ionizing radiation are widely used. The transient processes in electronic products are particularly dangerous, associated with an absorbed dose of radiation, leading to functional or irre-versible failures in the operation of onboard systems.","PeriodicalId":113054,"journal":{"name":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.34220/mamsp_214-218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In the onboard equipment, components of electronics, which have increased sensitivity to the effects of ionizing radiation are widely used. The transient processes in electronic products are particularly dangerous, associated with an absorbed dose of radiation, leading to functional or irre-versible failures in the operation of onboard systems.
集成芯片暴露于电离辐射时的辐射效应
在机载设备中,对电离辐射的影响更敏感的电子元件被广泛使用。电子产品中的瞬态过程特别危险,与吸收剂量的辐射有关,导致机载系统操作中的功能性或不可逆转的故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信