An effective algorithm for test application

China., 1991 International Conference on Circuits and Systems Pub Date : 1991-06-16 DOI:10.1109/CICCAS.1991.184444

Z. Zijian, Chen Junliang

引用次数: 0

Abstract

DTS (dynamic test sequence) algorithm the simplification and extension of adaptive experiment, is developed as an engineering approach for locating faults more efficiently at PCB functional testing level. The application in a practical ATE system is presented in detail. Comparison with the arbitrary test application shows its advantages.<>

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一种有效的测试应用算法

动态测试序列(DTS)算法是自适应实验的简化和扩展，是一种在PCB功能测试层面更有效地定位故障的工程方法。详细介绍了该方法在实际ATE系统中的应用。与任意测试应用程序的比较表明了它的优点。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

China., 1991 International Conference on Circuits and Systems

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