Device architecture for terahertz characterization of organic electro-optic ultra-thin films using time-domain attenuated total reflection method

Abstract

We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.