COST saves dollars: critical operating stress testing methods for early design analysis

Abstract

Improvements in product performance as well as reductions in field service calls are accompanied by eliminating design-correctable problems prior to first customer ship. These benefits are obtainable with enhanced early design test programs such as COST (critical operating stress test). The author outlines various test methods that achieve results in the short design cycle associated with commercial products. Digital logic boards and assembled video display terminals are the author's primary focus; however, the principles of COST apply to all electronic components.<>