Application of Bayesian neural network in electrical impedance tomography

J. Lampinen, Aki Vehtari, K. Leinonen
{"title":"Application of Bayesian neural network in electrical impedance tomography","authors":"J. Lampinen, Aki Vehtari, K. Leinonen","doi":"10.1109/IJCNN.1999.830787","DOIUrl":null,"url":null,"abstract":"In this contribution we present a method for solving the inverse problem in electric impedance tomography with neural networks. The problem of reconstructing the conductivity distribution inside an object from potential measurements on the surface is known to be ill-posed requiring efficient regularization techniques. We demonstrate that a statistical inverse solution, where the mean of the inverse mapping is approximated with a neural network gives promising results. We study the effect of input and output data representation by simulations and conclude that projection to principal axis is feasible data transformation. Also we demonstrate that Bayesian neural networks, which aim to average over all network models weighted by the model's posterior probability provide the best reconstruction results. With the presented approach estimation of some target variables, such as the void fraction (the ratio of gas and liquid), may be applicable directly without the actual image reconstruction. We also demonstrate that the solutions are very robust against noise in inputs.","PeriodicalId":157719,"journal":{"name":"IJCNN'99. International Joint Conference on Neural Networks. Proceedings (Cat. No.99CH36339)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IJCNN'99. International Joint Conference on Neural Networks. Proceedings (Cat. No.99CH36339)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IJCNN.1999.830787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18

Abstract

In this contribution we present a method for solving the inverse problem in electric impedance tomography with neural networks. The problem of reconstructing the conductivity distribution inside an object from potential measurements on the surface is known to be ill-posed requiring efficient regularization techniques. We demonstrate that a statistical inverse solution, where the mean of the inverse mapping is approximated with a neural network gives promising results. We study the effect of input and output data representation by simulations and conclude that projection to principal axis is feasible data transformation. Also we demonstrate that Bayesian neural networks, which aim to average over all network models weighted by the model's posterior probability provide the best reconstruction results. With the presented approach estimation of some target variables, such as the void fraction (the ratio of gas and liquid), may be applicable directly without the actual image reconstruction. We also demonstrate that the solutions are very robust against noise in inputs.
贝叶斯神经网络在电阻抗断层成像中的应用
在这篇文章中,我们提出了一种用神经网络求解电阻抗断层成像逆问题的方法。从表面上的电位测量重建物体内部电导率分布的问题是已知的不适定问题,需要有效的正则化技术。我们证明了一个统计逆解,其中逆映射的均值用神经网络近似,给出了有希望的结果。通过仿真研究了输入输出数据表示的效果,得出了向主轴投影是可行的数据转换方法。我们还证明了贝叶斯神经网络,其目的是平均所有网络模型的加权模型的后验概率提供了最好的重建结果。利用该方法可以直接估计一些目标变量,如空隙率(气液比),而无需实际的图像重建。我们还证明了该解决方案对输入中的噪声具有很强的鲁棒性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信