{"title":"A testbed for automatic modulation recognition using artificial neural networks","authors":"S.C. Kremer, J. Shiels","doi":"10.1109/CCECE.1997.614791","DOIUrl":null,"url":null,"abstract":"Automatic modulation recognition, the identification of the modulation scheme used to encode an unknown radio transmission, is an important component of electronic warfare communications systems. Existing technology is able to classify reliably (success rate /spl ges/90%) only at signal-to-noise ratios (SNRs) above 10 dB. In this paper, an artificial neural network is developed to classify signals with SNRs as low as 5 dB. Preprocessing steps and network performance on an initial test set are described.","PeriodicalId":359446,"journal":{"name":"CCECE '97. Canadian Conference on Electrical and Computer Engineering. Engineering Innovation: Voyage of Discovery. Conference Proceedings","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"CCECE '97. Canadian Conference on Electrical and Computer Engineering. Engineering Innovation: Voyage of Discovery. Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.1997.614791","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 32
Abstract
Automatic modulation recognition, the identification of the modulation scheme used to encode an unknown radio transmission, is an important component of electronic warfare communications systems. Existing technology is able to classify reliably (success rate /spl ges/90%) only at signal-to-noise ratios (SNRs) above 10 dB. In this paper, an artificial neural network is developed to classify signals with SNRs as low as 5 dB. Preprocessing steps and network performance on an initial test set are described.