Using An Extended Tersoff Interatomic Potential to Analyze The Static-Fatigue Strength of SiO2 under Atmospheric Influence

A. Yasukawa
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引用次数: 47

Abstract

Calculations of SiO 2 static-fatigue strength are used to show that the strength- degradation behavior of the material under the influence of the ambient atmosphere can be analyzed using an interatomic potential which is based on the Tersoff potential but extended to take charge transfer effects into account. The force-elongation curves of the Si-O interatomic bonds of the SiO2 are calculated with and without H 2 O in the atmosphere. Based on these curves, crack propagation behavior is analyzed, and calculated results are shown to correspond well with experimental results. Moreover, the calculated values of the strength decrease caused by the H 2 O also show fair agreement with the experimental values.
应用扩展tersoft原子间势分析大气影响下SiO2的静疲劳强度
二氧化硅静疲劳强度的计算表明,材料在环境气氛影响下的强度退化行为可以用基于Tersoff势的原子间势来分析,但扩展到考虑电荷传递效应。计算了在大气中添加和不添加h2o时SiO2的Si-O原子间键的力-伸长曲线。在此基础上对裂纹扩展行为进行了分析,计算结果与实验结果吻合较好。此外,h2o引起的强度降低的计算值也与实验值吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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