The new underfill materials with high adhesion strength for flip-chip applications

K. Kotaka, Y. Abe, Y. Homma
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引用次数: 3

Abstract

Epoxy acid anhydride materials are normally used as flow-type underfill materials. However, the underfill materials of this type, when humidified, tend to cause delamination at the interface with chips in solder reflow. To solve this problem, increasing the adhesive property of underfill material was attempted by investigating the relationship of adhesion strength with the glass transition temperature, high-temperature elastic modulus, and coefficient of moisture absorption for different resin compositions and different filler contents. As a result, the adhesion strength is higher and soldering heat resistance was found to be improved with higher glass transition temperature compositions. On the other hand, the adhesion strength was not affected by changes in the filler content. Based on these findings, an underfill material with high adhesion strength was developed. This new material did not cause delamination, even when treated by the level 2 JEDEC preconditioning test.
新型底填材料具有高粘接强度,适用于倒装芯片
环氧酸酐材料通常用作流型底填料。然而,这种类型的下填充材料,当加湿时,往往会在焊料回流中与芯片的界面处造成分层。为解决这一问题,通过研究不同树脂成分和填料含量下填充材料的玻璃化转变温度、高温弹性模量和吸湿系数与粘接强度的关系,试图提高下填充材料的粘接性能。结果表明,玻璃化转变温度越高,合金的粘附强度越高,焊接耐热性也越好。另一方面,粘结强度不受填料含量变化的影响。在此基础上,研制了一种具有高粘接强度的下填料。即使经过2级JEDEC预处理测试,这种新材料也不会引起分层。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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