Firmware Generation Architecture for Memory BIST

D. Sargsyan
{"title":"Firmware Generation Architecture for Memory BIST","authors":"D. Sargsyan","doi":"10.1109/EWDTS.2018.8524853","DOIUrl":null,"url":null,"abstract":"The safety and reliability requirements for automotive SoCs are becoming stronger requiring more complex and flexible solutions. Hardware implementation of test algorithms in memory built-in self-test (BIST) scheme allows in-field testing only with predefined instructions which restricts flexibility of system test in mission mode. In this paper, firmware generation architecture for memory BIST is described which allows to control mission mode access to embedded memories and makes the in-field testing more flexible.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"268 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2018.8524853","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

The safety and reliability requirements for automotive SoCs are becoming stronger requiring more complex and flexible solutions. Hardware implementation of test algorithms in memory built-in self-test (BIST) scheme allows in-field testing only with predefined instructions which restricts flexibility of system test in mission mode. In this paper, firmware generation architecture for memory BIST is described which allows to control mission mode access to embedded memories and makes the in-field testing more flexible.
内存BIST的固件生成体系结构
汽车soc的安全性和可靠性要求越来越高,需要更复杂和灵活的解决方案。内存内置自检(BIST)方案中测试算法的硬件实现只允许使用预先定义的指令进行现场测试,这限制了系统在任务模式下测试的灵活性。本文描述了一种用于内存测试的固件生成体系结构,该体系结构可以控制任务模式对嵌入式存储器的访问,使现场测试更加灵活。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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