Il-seob Kwon, Seung-Woo Baek, Kwan-Yuhl Cho, Hag-Won Kim
{"title":"Effects on Capacitor Lifetime of DPWM Method for Vienna Rectifier","authors":"Il-seob Kwon, Seung-Woo Baek, Kwan-Yuhl Cho, Hag-Won Kim","doi":"10.1109/IFEEC47410.2019.9014993","DOIUrl":null,"url":null,"abstract":"The effect of a capacitor on the overall system loss may not be critical, but a capacitor is an essential component in terms of overall system life. In this investigation, we analyzed the influence of the pulse width modulation method for a Vienna rectifier on the capacitor lifetime. The harmonics of the DC-Link capacitor current were analyzed to predict the lifetime of this component. In addition, the relationship between the equivalent series resistance of the capacitor and the harmonics was analyzed to predict the lifetime and for verification based on simulations.","PeriodicalId":230939,"journal":{"name":"2019 IEEE 4th International Future Energy Electronics Conference (IFEEC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 4th International Future Energy Electronics Conference (IFEEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IFEEC47410.2019.9014993","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The effect of a capacitor on the overall system loss may not be critical, but a capacitor is an essential component in terms of overall system life. In this investigation, we analyzed the influence of the pulse width modulation method for a Vienna rectifier on the capacitor lifetime. The harmonics of the DC-Link capacitor current were analyzed to predict the lifetime of this component. In addition, the relationship between the equivalent series resistance of the capacitor and the harmonics was analyzed to predict the lifetime and for verification based on simulations.