W. C. Yeong, Yen Yoon Tan, Sok Li Lim, K. W. Khaw, M. Khoo
{"title":"Variable sample size and sampling interval (VSSI) and variable parameters (VP) run sum charts for the coefficient of variation","authors":"W. C. Yeong, Yen Yoon Tan, Sok Li Lim, K. W. Khaw, M. Khoo","doi":"10.1080/16843703.2023.2177812","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":229439,"journal":{"name":"Quality Technology & Quantitative Management","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quality Technology & Quantitative Management","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/16843703.2023.2177812","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}