Vinícius Lisboa do Nascimento, Eric Valter Saconi Barbosa, S. Rondineau
{"title":"RF SP4T PIN Diode Switch for Mobile Satellite Communication System at Ku-band","authors":"Vinícius Lisboa do Nascimento, Eric Valter Saconi Barbosa, S. Rondineau","doi":"10.1109/WCNPS50723.2020.9263750","DOIUrl":null,"url":null,"abstract":"This paper presents the development of a switching circuit as a part of the design of a mobile transceiver in the Ku-band. It is used as a section of the radiating system with Rotman lenses and an antenna array. The microwave switch is designed with PIN diodes in a parallel architecture due to the necessity for low insertion loss, high insulation, low return loss, and possibly a high incident power. The microstrip circuit was developed and simulated showing good theoretical results and reliability to the deviation of a manufacturing process.","PeriodicalId":385668,"journal":{"name":"2020 Workshop on Communication Networks and Power Systems (WCNPS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Workshop on Communication Networks and Power Systems (WCNPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCNPS50723.2020.9263750","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents the development of a switching circuit as a part of the design of a mobile transceiver in the Ku-band. It is used as a section of the radiating system with Rotman lenses and an antenna array. The microwave switch is designed with PIN diodes in a parallel architecture due to the necessity for low insertion loss, high insulation, low return loss, and possibly a high incident power. The microstrip circuit was developed and simulated showing good theoretical results and reliability to the deviation of a manufacturing process.