{"title":"Combining different off-line handwritten character recognizers","authors":"C. Travieso, J. B. Alonso, Miguel A. Ferrer","doi":"10.1109/INES.2011.5954765","DOIUrl":null,"url":null,"abstract":"This present work presents a recognizer based on the combination of three Support Vector Machine (SVM) classifiers whose inputs have different parameters from characters. The three approaches of feature extraction for handwritten off-line digits, capital letters and lower case letters, have been chosen for improving the combination using database NIST-SD19. We have applied pre-processing in order to achieve greater inter-class discrimination and similarity. These three feature extractions are based on Kirsch masks with and without slant correction and Fourier elliptic descriptors.","PeriodicalId":414812,"journal":{"name":"2011 15th IEEE International Conference on Intelligent Engineering Systems","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 15th IEEE International Conference on Intelligent Engineering Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INES.2011.5954765","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This present work presents a recognizer based on the combination of three Support Vector Machine (SVM) classifiers whose inputs have different parameters from characters. The three approaches of feature extraction for handwritten off-line digits, capital letters and lower case letters, have been chosen for improving the combination using database NIST-SD19. We have applied pre-processing in order to achieve greater inter-class discrimination and similarity. These three feature extractions are based on Kirsch masks with and without slant correction and Fourier elliptic descriptors.