Power handling capability of an SOI RF switch

A. Joseph, A. Botula, J. Slinkman, R. Wolf, R. Phelps, M. Abou-Khalil, J. Ellis-Monaghan, S. Moss, M. Jaffe
{"title":"Power handling capability of an SOI RF switch","authors":"A. Joseph, A. Botula, J. Slinkman, R. Wolf, R. Phelps, M. Abou-Khalil, J. Ellis-Monaghan, S. Moss, M. Jaffe","doi":"10.1109/RFIC.2013.6569611","DOIUrl":null,"url":null,"abstract":"In this study, we define and investigate the maximum power handling capability (Pmax) in an SOI RF shunt branch switch. One of the critical factor in the Pmax is the non-uniform voltage division across an OFF shunt branch. In this study we provide a simple analytical method to determine the stack voltage imbalance. The Pmax is characterized as a function of various parameters, such as, switch stack height, channel length, Gate and Body bias, and process parameters. Overall, we find that the Pmax can be improved by reducing stack imbalance as well as device leakage currents, namely, GIDL.","PeriodicalId":203521,"journal":{"name":"2013 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2013.6569611","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15

Abstract

In this study, we define and investigate the maximum power handling capability (Pmax) in an SOI RF shunt branch switch. One of the critical factor in the Pmax is the non-uniform voltage division across an OFF shunt branch. In this study we provide a simple analytical method to determine the stack voltage imbalance. The Pmax is characterized as a function of various parameters, such as, switch stack height, channel length, Gate and Body bias, and process parameters. Overall, we find that the Pmax can be improved by reducing stack imbalance as well as device leakage currents, namely, GIDL.
SOI射频开关的功率处理能力
在本研究中,我们定义并研究了SOI射频分流分支开关的最大功率处理能力(Pmax)。Pmax的一个关键因素是在一个OFF分流分支上的不均匀电压划分。在本研究中,我们提供了一种简单的分析方法来确定堆叠电压不平衡。Pmax的特征是各种参数的函数,如开关堆叠高度、通道长度、栅极和体偏置以及工艺参数。总的来说,我们发现Pmax可以通过减少堆栈不平衡和器件漏电流(即GIDL)来提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信