Hardware reduction in concurrent error detection checkers in linear analog circuits using continuous checksums

M.W.T. Wong, Yingquan Zhou, Y. Min
{"title":"Hardware reduction in concurrent error detection checkers in linear analog circuits using continuous checksums","authors":"M.W.T. Wong, Yingquan Zhou, Y. Min","doi":"10.1109/TENCON.1995.496414","DOIUrl":null,"url":null,"abstract":"An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead.","PeriodicalId":425138,"journal":{"name":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.1995.496414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead.
使用连续校验和的线性模拟电路中并发错误检测检查器的硬件减少
讨论了由周英泉等(1995)提出的一种在线性模拟电路中基于连续校验和的并发错误检测(CED)方案中有效降低检测电路硬件开销的算法。该算法在不改变原有电路的情况下,生成合适的编码矩阵,使检测电路具有最优的硬件开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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