Microelectronics cooling and SEMI-THERM: a look back

Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Pub Date : 1994-02-01 DOI:10.1109/STHERM.1994.289000

R. Simons

引用次数: 14

Abstract

For the occasion of the 10th anniversary of the SEMI-THERM conference, this paper provides a look back at some of the developments that have taken place since its founding. Topics covered include thermal measurement, thermal characterization, thermal analysis and modeling, air cooling, water cooling, and immersion cooling.<>

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微电子冷却和半热:回顾

在SEMI-THERM会议成立十周年之际，本文回顾了自其成立以来所发生的一些发展。涵盖的主题包括热测量，热表征，热分析和建模，空气冷却，水冷却和浸入式冷却。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)

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