{"title":"Design and testing of facilities ground","authors":"D.R. Stockin","doi":"10.1109/EOSESD.2000.890104","DOIUrl":null,"url":null,"abstract":"The goal of this manuscript is to provide the base knowledge needed to be able to properly manage the testing and/or improvement of a facilities grounding system. Solutions for static charge problems rely on dedicated earth grounds with a resistance-to-ground typically specified at less than 5 ohms. Simple driven rods cannot normally reach this goal and often do not meet the NEC standard of 25 ohms resistance-to-ground. Proper testing and design will provide quantitative data to the EOS/ESD engineer and reduce the potential for revenue loss caused by ESD faults.","PeriodicalId":332394,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2000.890104","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The goal of this manuscript is to provide the base knowledge needed to be able to properly manage the testing and/or improvement of a facilities grounding system. Solutions for static charge problems rely on dedicated earth grounds with a resistance-to-ground typically specified at less than 5 ohms. Simple driven rods cannot normally reach this goal and often do not meet the NEC standard of 25 ohms resistance-to-ground. Proper testing and design will provide quantitative data to the EOS/ESD engineer and reduce the potential for revenue loss caused by ESD faults.