Simulation geometry rasterization for applications toward graphene interconnect characterization

Abstract

In this work, we present a novel methodology for geometric rasterization of arbitrary 3D planar geometries, and apply it to perform electromagnetic simulation based calibration for accurate high-frequency measurements of Graphene conductivity. The conductivity measurements may find application in the area of high-frequency Graphene-based circuits, specifically that of interconnects. Preliminary experimental and simulation results are shown and discussed.