Siva Satyendra Sahoo, T. D. A. Nguyen, B. Veeravalli, Akash Kumar
{"title":"QoS-Aware Cross-Layer Reliability-Integrated FPGA-Based Dynamic Partially Reconfigurable System Partitioning","authors":"Siva Satyendra Sahoo, T. D. A. Nguyen, B. Veeravalli, Akash Kumar","doi":"10.1109/FPT.2018.00041","DOIUrl":null,"url":null,"abstract":"Dynamic Partial Reconfiguration (DPR) can be used for time-sharing of computing resources within Partially Reconfigurable Regions (PRRs) in FPGA-based systems. The heterogeneous partitioning in such systems allows the user to exploit the application-specific mapping of Partially Reconfigurable Modules (PRMs) to PRRs to implement more efficient designs. It offers increased opportunities in optimizing the reliability of the system across multiple layers - from the low-level physical one to the higher application layer. This method, called cross-layer reliability, can potentially exploit the application-specific tolerances to the quality of service (QoS) to tackle the increasing device fault-rates more cost-effectively by distributing the fault-mitigation to different layers. In this work, we propose a QoS-aware cross-layer reliability-integrated design methodology for FPGA-based DPR systems. Specifically, our methodology analyzes the requirements of the applications in terms of Functional Reliability, System Lifetime and Makespan to determine the best possible combinations of reliability-oriented design choices in different layers. We report up to an average of 24% and 30% performance improvements for single and multi-objective optimization-based system partitioning.","PeriodicalId":434541,"journal":{"name":"2018 International Conference on Field-Programmable Technology (FPT)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Field-Programmable Technology (FPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPT.2018.00041","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Dynamic Partial Reconfiguration (DPR) can be used for time-sharing of computing resources within Partially Reconfigurable Regions (PRRs) in FPGA-based systems. The heterogeneous partitioning in such systems allows the user to exploit the application-specific mapping of Partially Reconfigurable Modules (PRMs) to PRRs to implement more efficient designs. It offers increased opportunities in optimizing the reliability of the system across multiple layers - from the low-level physical one to the higher application layer. This method, called cross-layer reliability, can potentially exploit the application-specific tolerances to the quality of service (QoS) to tackle the increasing device fault-rates more cost-effectively by distributing the fault-mitigation to different layers. In this work, we propose a QoS-aware cross-layer reliability-integrated design methodology for FPGA-based DPR systems. Specifically, our methodology analyzes the requirements of the applications in terms of Functional Reliability, System Lifetime and Makespan to determine the best possible combinations of reliability-oriented design choices in different layers. We report up to an average of 24% and 30% performance improvements for single and multi-objective optimization-based system partitioning.