Long recovery of the lower ionosphere from the quasi-electrostatic effects of cloud-tog-round lightning

Ningyu Liu
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Abstract

Early VLF events with a long recovery time on the order of tens of minutes have been studied by several recent works [Cotts and Inan, GRL, 34, L14809, 2007; Haldoupis et al., JGR, 39, L16801, 2012; Salut et al., JGR, 117, A08311, 2012]. It has been suggested that the long recovery is caused by long-lasting conductivity perturbations in the lower ionosphere, which can be created by sprites/sprite halos triggered by cloud-to-ground (CG) lightning [Moore et al., JGR, 108, 1363, 2003; Haldoupis et al., 2012].We recently developed a two-dimensional fluid model with simplified ionospheric chemistry for studying sprite halos [Liu, JGR, 117, A03308, 2012]. The model chemistry captures major ion species and reactions in the lower ionosphere. The simulation results on sprite halos caused by positive CG lightning indicated when the electron detachment process from O- ions is included, electron density may grow even at subbreakdown conditions and the sprite halo front can descend to a lower altitude than previously thought. In this talk, we present the simulation results on the dynamics of sprite halos caused by negative CG lightning. For the halos caused by positive CG, their ionization fronts typically become very sharp as they descend downward, so simulations may suffer from numerical instability eventually [Liu, 2012]. However, the ionization front of a negative halo caused by lightning of similar strength is smoother, and the model can simulate the entire lifetime of the ionospheric perturbations. We show the modeling results on the ionospheric perturbations created by the negative halo and discuss how the ionosphere recovers to its original state.
云圆闪电准静电效应下电离层的长恢复
最近的一些研究已经研究了恢复时间长达数十分钟的早期VLF事件[cottts和Inan, GRL, 34, L14809, 2007;[j] .中国生物医学工程学报,2016,33 (1):481 - 481,2012;[j].岩石力学与工程学报,2016,33(2):481 - 481。有人认为,长时间的恢复是由电离层下部的长期电导率扰动引起的,这可以由云对地(CG)闪电触发的精灵/精灵晕造成[Moore等人,JGR, 108,1363, 2003;Haldoupis et al., 2012]。最近,我们开发了一种基于简化电离层化学的二维流体模型来研究精灵晕[Liu, JGR, 117, A03308, 2012]。模型化学捕获了电离层下层的主要离子种类和反应。对正CG闪电引起的光晕的模拟结果表明,当考虑到电子与O离子的分离过程时,即使在亚击穿条件下,电子密度也会增加,光晕锋面也会下降到比以前想象的更低的高度。在这次演讲中,我们展示了负CG闪电引起的精灵光晕动力学的仿真结果。对于正CG引起的晕,它们的电离锋通常在下降时变得非常尖锐,因此模拟最终可能遭受数值不稳定[Liu, 2012]。而由类似强度的闪电引起的负晕电离锋较为平滑,该模型可以模拟电离层扰动的整个生命周期。我们展示了由负晕产生的电离层扰动的模拟结果,并讨论了电离层如何恢复到原始状态。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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