Terahertz 3-D Synthetic Aperture Imaging for Dielectric Properties Estimation

Abstract

A 220-235GHz terahertz three-dimensional imaging system is constructed based on general test and measurement instruments, operating in the stepped-frequency continuous wave. After a detailed description of the measurement setup, high-resolution three-dimensional images of two materials are obtained using range migration algorithm. From multiple views of the three dimensional image data, the thickness and permittivity of the measured materials are then estimated, providing an alternative of extracting material dielectric properties.