Predicted impact of latest h and e values on resistance and voltage traceability in the new SI (système international)

Abstract

This paper considers the impact of the planned redefinition of the SI on electrical traceability, with a focus on resistance and voltage calibration. The new SI will replace the 1990 values for the critical constants R_K and K_J. With the present state of experimental data, we can say with good confidence that the required relative changes will be of order the 2 × 10^-8 for R_K and 10 × 10^-8 for K_J. These changes will only be visible for a small number of top-level standards in NMIs and industry. Thus, no disruption in traceability is anticipated due to this change, and this paper is part of a communication campaign by the CCEM to ensure a smooth transition.