Angular Dependence of Electric Field vs. Current Density Characteristics in YBa_2Cu_3O_y Superconducting Thin Film with Columnar Defects

T. Fujiyoshi, T. Sueyoshi, M. Haruta, K. Yonekura, T. Ikegami, N. Ishikawa, S. Awaji, Kazuo Watanabe
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Abstract

The effects of columnar defects on the critical current density (Jc) and electric (E) vs. current density (J) characteristics were investigated for a YBa2Cu3Oy thin film prepared using a pulsed-laser deposition method. The YBa2Cu3Oy thin film was irradiated with 200 MeV Au ions from a direction θ=8.8°off the c-axis. Two peaks in the angular dependence of Jc were observed at the angles of θ=8.8°and θ=90°. These angles correspond to the directions of the columnar defect and intrinsic pinning, respectively. The E-J characteristics at various magnetic field angles can be described by the percolation transition model. The value of pinning parameter m increases at the angles of θ=8.8°and θ=90°. This result indicates that the efficiency of flux pinning is enhanced because fluxoids are effectively pinned by the columnar defects and intrinsic pinning or stacking faults in these directions.
具有柱状缺陷的YBa_2Cu_3O_y超导薄膜中电场与电流密度特性的角依赖性
研究了柱状缺陷对脉冲激光沉积制备的YBa2Cu3Oy薄膜临界电流密度(Jc)和电密度(E)与电流密度(J)特性的影响。用200 MeV Au离子从偏离c轴θ=8.8°方向照射YBa2Cu3Oy薄膜。在θ=8.8°和θ=90°角处出现了两个角依赖性峰。这些角度分别对应柱状缺陷和固有钉钉的方向。不同磁场角度下的E-J特征可以用渗流过渡模型来描述。在θ=8.8°和θ=90°角处,钉钉参数m值增大。结果表明,在这些方向上,柱状缺陷和固有的钉住或堆积缺陷有效地钉住了流体,从而提高了通量钉住效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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