Testability of one dimensional ILAs under multiple faults

M. Gala, K. Watson, D. Ross
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Abstract

Testing of one dimensional unilateral iterative logic arrays (ILAs) of combinational cells under multiple faults is discussed. It has been shown that it is possible to generate a test set for ILAs with primary outputs under multiple faults. Some ILAs have a constant number of test vectors independent of the size of the array. These types of arrays are called C-testable arrays. Present work proves that all useful one dimensional unilateral ILAs with only boundary outputs are not C-testable under multiple faults.<>
一维集成电路在多重故障下的可测试性
讨论了组合单元一维单边迭代逻辑阵列(ILAs)在多重故障条件下的测试。研究表明,在多个故障情况下,为具有主输出的ILAs生成测试集是可能的。一些ila具有与阵列大小无关的恒定数量的测试向量。这些类型的数组称为c可测试数组。目前的工作证明了所有有用的只有边界输出的一维单边ila在多个故障下都是不可c -可测试的
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