Reliability Research of GaN-Based blue Semiconductor Lasers

Chengwei Zhang, Wenyuan Liao, Shaohua Yang, Hongran Wang, Zhipeng Wei, G. Lu
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引用次数: 1

Abstract

With the development of GaN material epitaxy technology, GaN-based blue semiconductor lasers have gradually entered people's vision, and their power has been increased from 5mW to several hundred watts now, which meets the needs of people's dailylife. However, the defects produced in the process of the epitaxial growth of the material and the increase of the temperature can affect its operating performance. Although the reliability of GaN-based semiconductor lasers has been analysed and discussed by many foreign scholars, there are few reports in China. In this paper, based on previous research combined with the thermal generation mechanism of blue semiconductor lasers, the reliability research work and failure mechanism of GaN-based semiconductor lasers are summarised. The thermal characteristics are invested with simulated results by ANSYS, and corresponding improvement schemes are proposed. This helps to enhance the lifetime of GaN-based blue semiconductor lasers and further promote the application of blue lasers in industrial production and daily life.
gan基蓝色半导体激光器可靠性研究
随着GaN材料外延技术的发展,GaN基蓝色半导体激光器逐渐进入人们的视野,其功率也从5mW提高到现在的几百瓦,满足了人们日常生活的需要。然而,材料外延生长过程中产生的缺陷和温度的升高会影响其工作性能。虽然国外很多学者对氮化镓基半导体激光器的可靠性进行了分析和讨论,但国内的报道却很少。本文在前人研究的基础上,结合蓝色半导体激光器的热产生机理,对氮化镓基半导体激光器的可靠性研究工作和失效机理进行了总结。利用ANSYS对模拟结果进行了热特性分析,并提出了相应的改进方案。这有助于提高氮化镓基蓝色半导体激光器的寿命,进一步促进蓝色激光器在工业生产和日常生活中的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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