Carrier traps in polymeric insulating materials

M. Ieda, Y. Suzuoki, T. Mizutani
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Abstract

Recently, space charge in insulating materials has been pointed out to play an important role in the dielectric breakdown, especially in the DC insulation system. The nature of space charge is closely related to the carrier trapping phenomena. In this paper, natures of carrier traps in various polymers were investigated by using x-ray induced thermally stimulated current (TSC) and thermoluminescence (TL) techniques. The TSC and TL techniques are powerful especially in high and low temperature regions, respectively. Most polymers except those of high ionic conduction such as polyvinyl chloride show remarkable TSC and TL peaks due to trapped carriers, suggesting an abundance of carrier traps. Most of these peaks correspond to the onset of molecular motions in polymers, suggesting that the carrier detrapping is closely related to molecular motions. There exist many traps in crystallites and/or in their interfacial regions. In polyethylene (PE), there are five or six kinds of carrier traps, which are considered to be due to physical defects such as cavities. Both oxidation and γ-irradiation introduce new deep traps into PE and they greatly influence the electrical conduction in PE.
聚合物绝缘材料中的载流子陷阱
近年来,人们指出绝缘材料中的空间电荷在介质击穿中起着重要作用,特别是在直流绝缘系统中。空间电荷的性质与载流子捕获现象密切相关。本文采用x射线诱导热激发电流(TSC)和热释光(TL)技术研究了不同聚合物中载流子陷阱的性质。TSC和TL技术分别在高温和低温地区具有强大的应用能力。除聚氯乙烯等高离子导电性聚合物外,大多数聚合物由于捕获载流子而呈现出显著的TSC和TL峰,表明载流子陷阱丰富。这些峰大多与聚合物中分子运动的开始相对应,表明载流子脱扣与分子运动密切相关。在晶体和/或其界面区域存在许多圈闭。在聚乙烯(PE)中,有五到六种载流子陷阱,这些陷阱被认为是由于空洞等物理缺陷造成的。氧化和γ辐照都在聚乙烯中引入了新的深阱,并对聚乙烯的导电性产生了很大的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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