Performance analysis of a large-scale switching system for high-speed ATM networks

Abstract

This paper evaluates the performance of a proposed large-scale ATM multipoint switching system designed from a new technological perspective. The use of wafer-scale integration (WSI) technology is proposed which allows the entire system to be implemented on a single silicon wafer. Wafer-scale technology offers significant potential advantages such as higher reliability and performance with reduced power and cost, and is well-suited to switching systems. WSI permits us to consider this new design which would not be practical in a system using conventional technologies.