Removal of defect bound exciton in aged monolayer WS2 by laser processing

Yuxiang Tang, Yizhen Sui, Runlin Miao, Han Li, K. Wei, Hao Hao, Yu Liu, Yuze Hu, Junhu Zhou, Yating Ma, Xiang’ai Cheng, Tian Jiang
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引用次数: 1

Abstract

The exciton complexes in two-dimensional materials have long fascinated scientists and researchers for their mechanisms in fundamental photo-physics. And it is well established that the evolution of defect bound excitons in twodimensional semiconducting TMDs brings largely unexplored opportunities for tailoring their optoelectronic properties. Yet thus far, the properties of defect bound excitons of TMDs have been rarely investigated. In this work, the intrinsic properties of defect bound excitons in aged CVD-grown monolayer WS2 are experimentally studied by the steady-state photoluminescence measurement. Specifically, the photoluminescence mapping experiment is conducted to demonstrate the spatial distribution of the defect bound excitons, whose spectral feature is located ~0.2 eV below the neutral free Aexcitons. Additionally, the power-dependent photoluminescence experiment is applied to investigate the behavior of the defect-state photoluminescence and a significant nonlinear dependence of defect bound excitons on excitation power is revealed. Furthermore, we directly observed the disappearance of defect-state photoluminescence by exposing sample to high laser power irradiation, which can be explained by the enhanced desorption process of molecules physiosorbed on surfaces under laser irradiation. The results of our work provide a comprehensive understanding for the defect bound excitons in monolayer tungsten disulfide, which is essential in promoting the development of defect engineering about two-dimensional semiconducting TMDs and may pave the way for tailoring the performance of the optoelectronic device.
时效单层WS2中缺陷束缚激子的激光去除
二维材料中的激子复合物因其在基本光物理中的机制而长期吸引着科学家和研究人员。二维半导体tmd中缺陷束缚激子的演化为调整其光电特性带来了大量未开发的机会。然而到目前为止,对tmd的缺陷束缚激子性质的研究还很少。本文采用稳态光致发光的方法,研究了老化cvd单层WS2中缺陷束缚激子的固有特性。具体来说,通过光致发光映射实验证明了缺陷束缚激子的空间分布,其光谱特征位于中性自由激子下方~0.2 eV。此外,利用功率依赖光致发光实验研究了缺陷态光致发光的行为,揭示了缺陷束缚激子对激发功率的非线性依赖。此外,我们直接观察到,将样品暴露在高功率激光照射下,缺陷态光致发光消失,这可以解释为激光照射下表面物理吸附分子的脱附过程增强。我们的工作结果提供了对单层二硫化钨中缺陷束缚激子的全面理解,这对于促进二维半导体tmd缺陷工程的发展至关重要,并可能为定制光电器件的性能铺平道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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