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Measurement Of Secondary Electron Emission Coefficient From MgO Protecting Layer

Digest of Papers. Microprocesses and Nanotechnology'98. 198 International Microprocesses and Nanotechnology Conference (Cat. No.98EX135) Pub Date : 1998-07-13 DOI:10.1109/IMNC.1998.730086
E. Choi, H. Oh, Y. Kim, J. Ko, T. Cho, D.I. Kim, G. Cho, S. Kang
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氧化镁保护层二次电子发射系数的测量
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Digest of Papers. Microprocesses and Nanotechnology'98. 198 International Microprocesses and Nanotechnology Conference (Cat. No.98EX135)
Digest of Papers. Microprocesses and Nanotechnology'98. 198 International Microprocesses and Nanotechnology Conference (Cat. No.98EX135)
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