Nanotube memories for space applications

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-06 DOI:10.1109/AERO.2004.1368024

M. Lovellette, A. Campbell, H. Hughes, R.K. Lawerence, J. Ward, M. Meinhold, T.R. Bengtson, G.F. Carleton, B. Segal, T. Rueckes

引用次数: 12

Abstract

The radiation hardness characteristics of nano-electromechanical single-walled carbon nanotube (SWNT) memory elements has been studied. The NRAM bits have been exposed to 100 krad, 1 Mrad and 10 Mrad of gamma-radiation. Initial test results indicate that NRAM is an extremely radiation hard memory.

查看原文本刊更多论文

空间应用纳米管存储器

研究了纳米机电单壁碳纳米管(SWNT)记忆元件的辐射硬度特性。NRAM位暴露在100克、1毫和10毫的伽马辐射中。初步测试结果表明，NRAM是一种辐射极强的硬存储器。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720)

自引率

0.00%

发文量