A Ka-band RF-MEMS phase shifter approach based on a novel dual-state microstrip line

C. Siegef, V. Zieglerl, U. Prechtel, B. Schonlinner, H. Schumacher
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引用次数: 13

Abstract

This paper presents the design and realization of a 3-bit RF-MEMS based phase shifter at 34 GHz using a very-low complexity and highly reliable RF-MEMS technology on silicon. The three bits of the circuit use different techniques to achieve the necessary phase shifts. One new design technique, the dual-state microstrip line, is enabled by the presented RF-MEMS technology and changes the effective epsivr of a microstrip transmission line by lifting part of it into the air. This leads to a change in the electrical length of the microstrip transmission line, which in turn results in a phase shift. The related insertion loss of the 45deg bit is less then -0.35 dB and a matching better -19 dB for both switching states. Further on, a loaded-line bit with 45deg of phase shift is realized by switching between a capacitive and an inductive load. The capacitive switching state shows an insertion loss of -0.4 dB and a matching better -13 dB, while the inductive load has an insertion loss of -0.7 dB and a matching of -25 dB. The loaded-line bit combined with the dual-state microstrip line is used for the 90deg-bit. An additional miniaturized switched line phase shifter is implemented for the 180deg state. The three bits were combined and measured in all states. The results of the 3-bit phase shifter are shown with a mean insertion loss of -2.2 dB and a phase derivation of 13.25deg at 34 GHz.
基于新型双态微带线的ka波段RF-MEMS移相器方法
本文介绍了一种基于3位RF-MEMS的34 GHz移相器的设计和实现,该移相器采用极低的复杂性和高可靠的RF-MEMS技术。电路的三个位使用不同的技术来实现必要的相移。一种新的设计技术,双态微带线,是由RF-MEMS技术实现的,通过将微带传输线的一部分提升到空气中来改变微带传输线的有效效率。这会导致微带传输线的电长度发生变化,从而导致相移。45度位的相关插入损耗小于-0.35 dB,两种开关状态的匹配性能更好,为-19 dB。此外,通过在容性负载和感性负载之间切换,实现了45度相移的负载线位。电容开关状态的插入损耗为-0.4 dB,匹配性能较好,为-13 dB,而电感负载的插入损耗为-0.7 dB,匹配性能为-25 dB。90度钻头采用负载线与双态微带线相结合的方式。另外一个小型化的开关线移相器用于180度状态。将这三个比特组合在一起,并在所有状态下进行测量。结果显示,在34 GHz时,3位移相器的平均插入损耗为-2.2 dB,相位导数为13.25°。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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