A new development of failure bound method-diagnosable conditions with application for analog systems

Abstract

The failure bound method for analog fault diagnosis is developed in this paper. The necessary and sufficient condition for diagnosability of a faulty set as an analytic condition is derived. Based on these conditions another form of pseudo circuit is created, so that the diagnosis process can be continued with insufficient test points. Furthermore, a graphical condition for the diagnosability of a faulty set is also presented. Finally, a diagnosis algorithm is proposed with an example.<>