{"title":"APPROACH OF DIGITAL DEVICES DIAGNOSTIC ON THE BASIS OF FUZZY LOGIC","authors":"D. Bystrov","doi":"10.1145/3454127.3456570","DOIUrl":null,"url":null,"abstract":"Due to high pace of development of manufacture and constantly growing complexity of computer aids, manual operations of the control of diagnostics, report and analysis of defect becomes more complex and ineffective. It requires wide introduction in manufacture computer aids of diagnostic expert systems (ES) with standard means of algorithmic technology of the solution of the user tasks: data manager (DM) of industrial purpose, ATE both diagnosing and advanced dialogue subsystem of debugging and editing of the programs of modern operating systems. Object of the control and diagnostics is the digital device (DD), executed on the printed-circuit-board and includes small, average, large, and super large integrated circuits. The achievement of modern integrated technology promotes a decrease of labor input of manufacturing of modules, but thus continuous functional complication occurs hence, procedures of the control and diagnosing DD becomes more labor-consuming and expensive. It requires perfection of methods of maintenance of the given degree of quality.","PeriodicalId":432206,"journal":{"name":"Proceedings of the 4th International Conference on Networking, Information Systems & Security","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 4th International Conference on Networking, Information Systems & Security","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3454127.3456570","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Due to high pace of development of manufacture and constantly growing complexity of computer aids, manual operations of the control of diagnostics, report and analysis of defect becomes more complex and ineffective. It requires wide introduction in manufacture computer aids of diagnostic expert systems (ES) with standard means of algorithmic technology of the solution of the user tasks: data manager (DM) of industrial purpose, ATE both diagnosing and advanced dialogue subsystem of debugging and editing of the programs of modern operating systems. Object of the control and diagnostics is the digital device (DD), executed on the printed-circuit-board and includes small, average, large, and super large integrated circuits. The achievement of modern integrated technology promotes a decrease of labor input of manufacturing of modules, but thus continuous functional complication occurs hence, procedures of the control and diagnosing DD becomes more labor-consuming and expensive. It requires perfection of methods of maintenance of the given degree of quality.