{"title":"Dealing with data pitfall in RFID network","authors":"Chalres Z. Liew, Raymond Shaw","doi":"10.1109/ICCE-CHINA.2014.7029853","DOIUrl":null,"url":null,"abstract":"In this brief paper, the issue of pitfall effect in RFID network is studied. We model the system as multi-hop random walk mesh network and discuss this phenomenon connecting with Galton effect. Based on analysis, a strategy for dealing with the pitfall problem is proposed with self-adaptive operation for each node to adjust the probability of dynamical selecting the routine branches for load balance with default equal probability distribution. Experimental results show that the system with proposed approach provides an efficient and more balanced in data distribution pattern.","PeriodicalId":367120,"journal":{"name":"2014 IEEE International Conference on Consumer Electronics - China","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Conference on Consumer Electronics - China","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCE-CHINA.2014.7029853","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this brief paper, the issue of pitfall effect in RFID network is studied. We model the system as multi-hop random walk mesh network and discuss this phenomenon connecting with Galton effect. Based on analysis, a strategy for dealing with the pitfall problem is proposed with self-adaptive operation for each node to adjust the probability of dynamical selecting the routine branches for load balance with default equal probability distribution. Experimental results show that the system with proposed approach provides an efficient and more balanced in data distribution pattern.