D. Michael, R. Kourtney, S. Joao, S. Steven, Z. Marc
{"title":"Direct Tension and Fatigue Characterization of AM Ti-6Al-4V Defects: A Microsample Approach","authors":"D. Michael, R. Kourtney, S. Joao, S. Steven, Z. Marc","doi":"10.33599/nasampe/s.21.0480","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":283880,"journal":{"name":"SAMPE neXus 2021","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SAMPE neXus 2021","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33599/nasampe/s.21.0480","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}