{"title":"Novel Flexible True Random Number Generator Using Resistive Switching Memory","authors":"Heba Abunahla, K. Humood, B. Mohammad","doi":"10.1109/icecs53924.2021.9665601","DOIUrl":null,"url":null,"abstract":"This work reports a novel true random number generator (TRNG) using Cu/GO/Pt memristive stack. The volatile regime of the device is utilized to achieve natural stochasticity among the switching cycles. An efficient Arduino-based circuit is built and connected to the memristor to produce the data with low power and cost overheads. National Institute of Standards and Technology (NIST) tests are used to assess the randomness of the generated bits. The produced data passes all NIST tests without the post-processing steps used by most of the true random number generators reported in the literature. Flexibility is a unique feature of the device reported in this work, being fabricated on flexible polymer substrate. This enhances the value of the TRNG and facilitates its deployment in smart wearable devices. This work is considered a great millstone towards efficient flexible secure smart electronics.","PeriodicalId":448558,"journal":{"name":"2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"142 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icecs53924.2021.9665601","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This work reports a novel true random number generator (TRNG) using Cu/GO/Pt memristive stack. The volatile regime of the device is utilized to achieve natural stochasticity among the switching cycles. An efficient Arduino-based circuit is built and connected to the memristor to produce the data with low power and cost overheads. National Institute of Standards and Technology (NIST) tests are used to assess the randomness of the generated bits. The produced data passes all NIST tests without the post-processing steps used by most of the true random number generators reported in the literature. Flexibility is a unique feature of the device reported in this work, being fabricated on flexible polymer substrate. This enhances the value of the TRNG and facilitates its deployment in smart wearable devices. This work is considered a great millstone towards efficient flexible secure smart electronics.