{"title":"Rule base inspection using algorithmic approach for data-access oriented knowledge-based systems","authors":"Fang-Yie Leu, Chien-Chiao Yang","doi":"10.1109/CMPSAC.1990.139344","DOIUrl":null,"url":null,"abstract":"The authors describe an effective rule-base inspection method that checks rule-base consistency and completeness by using an algorithmic approach. A knowledge base in this method is represented by a finite state diagram called a context transition diagram. Through this diagram, some errors and anomalies of the rule base can be clearly illustrated and identified. The characteristics of states representing such errors and anomalies in the state diagram are investigated, and the algorithms for effectively identifying those defects are introduced.<<ETX>>","PeriodicalId":127509,"journal":{"name":"Proceedings., Fourteenth Annual International Computer Software and Applications Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Fourteenth Annual International Computer Software and Applications Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CMPSAC.1990.139344","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The authors describe an effective rule-base inspection method that checks rule-base consistency and completeness by using an algorithmic approach. A knowledge base in this method is represented by a finite state diagram called a context transition diagram. Through this diagram, some errors and anomalies of the rule base can be clearly illustrated and identified. The characteristics of states representing such errors and anomalies in the state diagram are investigated, and the algorithms for effectively identifying those defects are introduced.<>