{"title":"Estimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurements","authors":"X. Tao, S.N. Li, S. Hui","doi":"10.1109/ECCE.2010.5618051","DOIUrl":null,"url":null,"abstract":"Although critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature Tj and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment.","PeriodicalId":161915,"journal":{"name":"2010 IEEE Energy Conversion Congress and Exposition","volume":"77 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Energy Conversion Congress and Exposition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCE.2010.5618051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Although critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature Tj and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment.