Methods and Technical Means for Ensuring Uniformity of Nanoparticle Size Measurements

A. A. Bagdun, V. L. Solomakho
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Abstract

The paper proposes a set of technical tools for solving the problem of ensuring the uniformity of measurements of micro- and nanoparticles. To do this, it is necessary to ensure the traceabilityof particle size measurements to a unit of length – a meter, as well as equivalent diameters used in measurements in various dispersed media (aerosols and suspensions). To ensure traceability of particle diameter measurements to the meter, it is proposed to use a nanomeasuring machine with an atomic force microscope as a probing system. The paper presents a diagram of the measuring system, describes the principle of operation of the machine and the method for measuring particle sizes. The main alleged sources of errors in particle measurement by this method are also identified. To ensure the traceability of measurements of the hydrodynamic diameter of nanoparticles, which characterizes particles in a liquid (suspension), it is proposed to use a nanoparticle size analyzer that implements the method of dynamic light scattering. The scheme of the analyzer with a description of the principle of measuring the size of nanoparticles by the method of dynamic light scattering is presented in the paper. The scheme of the column of the analyzer of the differential electrical mobility of particles is presented to ensure the traceability of measurements of their diameter, which is equivalent in electrical mobility. Diameter is usually used to characterize particles in the aerosol state. A diagram of an analyzer for the differential electric mobility of particles is given with a description of the operating principle, a formula for calculating the particle diameter is derived.
确保纳米颗粒尺寸测量均匀性的方法和技术手段
本文提出了一套解决微、纳米颗粒测量均匀性问题的技术工具。要做到这一点,有必要确保颗粒尺寸测量的可追溯性,以长度为单位-一米,以及用于测量各种分散介质(气溶胶和悬浮液)的等效直径。为了保证颗粒直径测量的可追溯性,提出了采用原子力显微镜的纳米测量机作为探测系统。本文给出了测量系统的示意图,阐述了机器的工作原理和测量粒度的方法。文中还指出了这种方法测量粒子误差的主要来源。为了确保表征液体(悬浮液)中颗粒的纳米颗粒水动力直径测量的可追溯性,提出了使用实现动态光散射方法的纳米颗粒尺寸分析仪。本文介绍了用动态光散射法测量纳米颗粒尺寸的原理,并给出了该分析仪的设计方案。提出了颗粒微分电迁移率分析仪色谱柱的设计方案,以保证颗粒直径测量的可追溯性,颗粒直径在电迁移率上是等效的。直径通常用于表征气溶胶状态下的颗粒。给出了粒子微分电迁移率分析仪的示意图,阐述了其工作原理,推导了粒子直径的计算公式。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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