{"title":"Deep Neural Network–Based Detection and Verification of Microelectronic Images","authors":"Md. Alimoor Reza, Zhenhua Chen, David J. Crandall","doi":"10.1007/s41635-019-00088-4","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":122880,"journal":{"name":"Journal of Hardware and Systems Security","volume":"8 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Hardware and Systems Security","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s41635-019-00088-4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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