Quasi-double gate mode for sleep transistors in UTBB FD SOI low-power high-speed applications

D. Bol, V. Kilchytska, J. De Vos, F. Andrieu, D. Flandre
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引用次数: 5

Abstract

Power-gating enables low stand-by power for high-speed applications. In this paper, we exploit the unique feature of quasi-double gate (QDG) mode MOSFETs in UTBB SOI to boost the performances of the power-gating sleep transistor. According to experimental results on a 10-nm BOX, at nominal Vg QDG mode enables up to 35% width and thereby leakage reduction for the sleep transistor. At circuit level, a charge pump architecture is proposed to generate the QDG back-gate bias for a 100-mA power-gated CPU with sub-100 ns wake-up/sleep times and negligible power/area overheads.
UTBB FD SOI低功耗高速应用中休眠晶体管的准双栅极模式
功率门控使高速应用的低待机功率。在本文中,我们利用UTBB SOI中准双栅(QDG)模式mosfet的独特特性来提高功率门控休眠晶体管的性能。根据在10nm BOX上的实验结果,在标称Vg QDG模式下,休眠晶体管的宽度可达35%,从而减少泄漏。在电路层面,提出了一种电荷泵架构,用于产生100 ma电源门通CPU的QDG后门偏置,其唤醒/睡眠时间低于100 ns,功耗/面积开销可忽略不计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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